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Ships within 48 hours · Estimated delivery Sep 25 - Sep 30
Available as NIST Traceable or as Certified against NIST Standard
P Boron doped
Super sharp tip for highest resolution combined with intermediate spring constant for applications including:
UVM1 methacrylate-based solution on exposure to light hardens to clear film
Box has a clear lid and a black base
ElectriCont-G Pin Stub Holders Available as NIST Traceable orElectrical, Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as: scanning capacitance microscopy (SCM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The
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